Product Reference
PTP-R4_77K

Product Introduction
Cryogenic Probe Test Platform is mainly used for testing chips, wafers and packaged devices, with an operating temperature range of 5K-80K; supports various probes including DC and microwave.

Key Features
RF Bandwidth DC-18GHz
Vacuum acquisition and display function, display range 1E-4Pa~1E+5Pa
4-channel temperature acquisition and display function 5K~300K
Secondary cold plate temperature controllable(5~80K)
Vacuum degree ≤9×10-4Pa (cryogenic state)
RF input/output interfaces SMA(F2.92); quantatity: 6
Temperature detection interface Y50H-1419ZJ10A; quantatity: 1
Power supply interface Y50H-1419ZJ10A; quantatity: 1
Cryogenic noise source output SMA(F2.92); quantatity: 1
Probe installation positions 6 positions with interface type SMAF2.92 rigid cable female connector. Probes can be precisely adjusted in xyz coordinates through external adjustment unit of vacuum chamber, with coarse adjustment range of ±25mm by lead screw and fine adjustment range of ±12.5mm by micrometer.

Note
(1) Default unit for dimensions: millimeter (mm)/degree (°); Unless otherwise specified, default tolerances are: x±1.0/x±0.50 for dimensions, ±1° for angles, and ±0.3 for holes;
(2) Dimensions, interfaces and operating temperature ranges can be customized according to customer requirements. 

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